Cornell researchers have used high-resolution 3D imaging to detect, for the first time, the atomic-scale defects in computer chips that can sabotage their performance. The imaging method, which was ...

Cornell researchers have used advanced electron microscopy to identify "mouse bite" defects in 3D transistors for the first time ...

Transmission electron microscopes (TEMs) allow researchers at the forefront of energy technology to study next-generation ...

Not all defects are visible with the same microscope. Explore how resolution, contrast, and signal interpretation shape semiconductor failure investigations.

There are a lot of situations where a research group may turn to an electron microscope to get information about whatever system they might be studying. Assessing the structure of a virus or protein, ...

Atoms measure roughly 0.1 nanometers across, a scale so small that scientists spent more than six decades developing ...

Scientists have developed a new imaging technique that uses a novel contrast mechanism in bioimaging to merge the strengths of two powerful microscopy methods, allowing researchers to see both the ...