New Boundary-Scan (JTAG) Test and In-System Programming controller provides users with ease of connection and concurrent (ganged) programming and testing on four JTAG chains at sustained Test Clock ...
You most likely associate JTAG—IEEE1149.1—with testing your product in the late stages of its design cycle; you may use the test access that JTAG provides for production test, and you may therefore be ...
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