AZOM

Revolutionizing Cryo-Sample Preparation: High-Resolution Insights with Cryogenic FIB-SEM

Observations at the nanoscale can provide profound insights into materials science. Yet, the characterization of beam-sensitive and reactive materials has proven challenging. In order to address this ...
AZOM

Automation for Sustained Quality in TEM Sample Preparation

Material fabrication processes can gradually create changes in the material’s final properties; thus, to verify the material’s final quality and comprehend any inconsistencies, scientists need a ...
AZoNano

Combining Flexibility and Automation in FIB-SEM for TEM Lamella Preparation

Thought LeadersProf. Dariusz Jarzabek & Martina SchenkelProfessor & Applications Development EngineerInstitute of Fundamental Technological Research & ZEISS In this interview, AZoNano speaks with ...
Michigan Technological University

Hitachi FB-2000A FIB

The Hitachi FB-2000A FIB uses a beam of focused high-energy (30 kV) gallium ions to remove material in a very controlled manner from inorganic specimens. The FB-2000A is a single beam system; that is, ...
AZoNano

TEM Lamella Preparation: Combine Flexibility and Automation using the ZEISS Crossbeam FIB-SEM

TEM lamella preparation is essential for almost any FIB-SEM user. Go beyond conventional TEM sample preparation with the ZEISS Crossbeam FIB-SEM. Users can maximize their productivity for TEM lamella ...
University of Wyoming

Wind River: FIB-SEM

CASI houses the Thermo Scientific Helios 5 UX DualBeam Focus Ion Beam/Scanning Electron Microscope (FIB-SEM) to accelerate nanotechnology research and development at the University of Wyoming. This ...
Nature

Comprehensive microcrystal electron diffraction sample preparation for cryo-EM

Microcrystal electron diffraction (MicroED) has advanced structural methods across a range of sample types, from small molecules to proteins. This cryogenic electron microscopy (cryo-EM) technique ...
Michigan Technological University

FIB Preparation Options

In the single-beam FIB, such as our Hitachi FB-2000A FIB, some milling will occur during observation of the specimen. Surface features, such as thin films, can be milled away during this process. In ...
Nature

Patch-Based convolutional neural networks for multiple microstructural features detection in FIB-SEM micrographs of irradiated nuclear fuel

Focused ion beam scanning electron microscopy (FIB-SEM) tomography has increasingly been utilized for acquiring three-dimensional (3D) microstructure features at the sub-micron scale in irradiated ...
The Scientist

The Expansion of Volume Electron Microscopy

With the inventions of transmission electron microscopy (TEM) in 1931 and scanning electron microscopy (SEM) shortly after in 1937, scientists gained an unprecedented ultrastructural view of the ...