Champaign, National Energy Technology Laboratory, Argonne National Laboratory, and Monash University published a technical ...

The semiconductor industry is undergoing a transformation. This transformation is driven by the critical role semiconductors play in decarbonization and digitalization and their ability to enable ...

Plus, agentic EDA and AI-generated analog layout, small chip fabs, diamond-based defect inspection, large-area nanoimprint ...

The shift from software-defined to AI-defined vehicles raises questions about whether the hardware can keep up.

As models evolve faster than silicon cycles, chip architects must balance flexible compute, data movement, and ...

Because in the age of AI, performance is no longer determined by a single chip itself. It is shaped by how efficiently the ...

Increasing power density makes heat, stress, and aging harder to predict, and more critical to address earlier in the design flow.

Researchers at Carl Zeiss SMT and ASML published a technical paper titled “Hyper-NA: a system with a numerical aperture of at least 0.75.” Abstract Summary: The researchers examine Hyper-NA EUV ...

Test vendors are adapting to changing connector architectures and extreme alignment tolerances as co-packaged optics heads ...

How complementary inspection and metrology techniques can detect smaller defects and distinguish among a wide range of defect types within a unified workflow.

Distributed NVM supports high-endurance telemetry logging, functional safety, and time-sensitive networking where resilience ...

Researchers at ETH Zürich, CISPA, and New York University published a technical paper titled “Terracotta: Enabling the ...