Abstract: This study develops a parameter extraction flow for Hot Carrier Degradation (HCD) model in advanced technology based on the neural network (NN). Four types of parameters of the BSIM-CMG ...
A Neural Network based Fast Parameter Extraction of Compact Hot Carrier Degradation Model in FinFETs
Abstract: This study comprehensively investigates the parameter extraction flows for Hot Carrier Degradation (HCD) in advanced technology based on Neural Network (NN). The emerging NN-based approach ...
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